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Spatial Attention Supervision for Defect Localization: Exploiting Ground-Truth Masks as Training Signal in Diffusion-Augmented Defect Detection
Ground-truth defect masks in industrial inspection datasets are typically reserved for evaluation. This paper repurposes them as spatial supervision signals during training of classification networks, teaching a model not just what to predict but where to look. The method adds an activation-based attention alignment loss that steers convolutional feature maps toward defect regions, in a mixed-supervision formulation that also accommodates samples without masks, such as diffusion-generated images. Combined with DDPM augmentation, synthetic images contribute quantity while masks contribute spati
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Evidence & attribution
- arXiv · AI, language, vision and robotics · 2026-09-05T19:20:23.000Z
First collected: 2026-09-20T21:32:07.623Z. This is not the publication date.