SOURCE-LINKED INTELLIGENCE
LUMIN: Lightweight Universal Manufacturing Inspection Network for Anomaly Detection
Industrial anomaly detection faces two engineering bottlenecks: memory bank construction latency and inference efficiency. Traditional sampling algorithms (Farthest Point Sampling, K-Means, etc.) rely on numerous backbone forward passes and iterative distance computations, with construction times ranging from minutes to hours; heavy computation components such as multi-scale feature extraction struggle to meet the millisecond-level real-time requirements of production lines. This paper focuses on sampling efficiency and inference optimization for industrial deployment with two core contributio
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Evidence & attribution
- arXiv · AI, language, vision and robotics · 2026-09-04T06:12:10.000Z
First collected: 2026-09-20T22:31:48.298Z. This is not the publication date.