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Real-Time Atomic-Resolution Electron Phase Imaging without Probe Calibration via Ptychography-Supervised Learning
Atomic-scale phase imaging is central to resolving defects, interfaces, and weakly scattering atoms that govern the behavior of nanoscale materials. Electron ptychography delivers sub-ångström phase sensitivity but remains an offline technique, because its iterative reconstruction is computationally expensive and sensitive to experimental calibration, preventing live use during data acquisition. Here, a ptychography-supervised local inference framework is presented that converts four-dimensional scanning transmission electron microscopy (4D-STEM) into an acquisition-compatible phase-imaging wo
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Evidence & attribution
- arXiv · AI, language, vision and robotics · 2026-09-22T04:40:41.000Z
First collected: 2026-09-23T04:21:13.910Z. This is not the publication date.